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Physics

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Ellipsometry and Polarized Light

Ellipsometry and Polarized Light

The Polarization state of light reflected from a surface and its variations are measured by ellipsometry. Basics: Ellipsometry is an optical technique for the investigation of the dielectric properties (complex refractive index or dielectric function) of thin films. It has applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research [...]